Introductory Pricing
Welcome to the Nano Imaging and Material Analysis Centre (NIMAC) specialists in providing Scanning & Transmission Electron Microscopy (SEM, TEM) and state-of-the-art analytical techniques, training and services to industry.
NEWS - Innovation Vouchers
3/9/10 -- Clients can utilize innovation vouchers (Link) to access the skills and research expertise in NIMAC. Please contact NIMAC for further information.
Capabilities
- Transmission Electron Microscopy (TEM) HR-TEM Analysis
- Dual Beam FIB (DB-FIB) - Product/ Failure analysis
- Focused Ion Beam (FIB) - Sub-surface information
- Scanning Electron Microscopy (SEM) - Surface analysis
- X-Ray Photoelectron Spectroscopy (XPS/ESCA) - Chemical
Services
NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), DualBeam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), X-Ray Photoelectron Spectroscopy (XPS/ESCA), TEM analysis, SEM Service, EM service, Electron Microscopy service, FIB service, Materials analysis, Failure analysis, Product analysis, Innovation vouchers, Surface analysis, Analytical Service Company, UK, Ireland, Dublin.